The purpose of STM8S103K3T3 MCU Flash Memory Unlocking is to restore encrypted firmware from stm8s103k3 flash memory and copy the original heximal to new microcontroller stm8s103k3;
Unless otherwise specified, all voltages are referred to VSS.
Unless otherwise specified the minimum and maximum values are guaranteed in the worst conditions of ambient temperature, supply voltage and frequencies by tests in production on 100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics are indicated in the table footnotes and are not tested in production which can be applied for stm8s003f3 microcontroller memory cracking. Based on characterization, the minimum and maximum values refer to sample tests and represent the mean value plus or minus three times the standard deviation (mean ± 3 S).
Unless otherwise specified, typical data are based on TA = 25 °C, VDD = 5 V. They are given only as design guidelines and are not tested.
Typical ADC accuracy values are determined by characterization of a batch of samples from a standard diffusion lot over the full temperature range, where 95% of the devices have an error less than or equal to the value indicated (mean ± 2 S) by stm8s003k3 secure microcontroller memory unlocking.
Unless otherwise specified, all typical curves are given only as design guidelines and are not tested.
The loading conditions used for pin parameter measurement are shown in below Figure