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There is possibility that Clone Microcontroller Memory Content Remanence from previously erased memory. This could create problems with secure devices where designers assumed that all sensitive information is gone once the memory is erased. If the passwords or secret keys can be extracted from Integrated circuit afterwards, it could affect confidentiality of the previously encrypted information.

Microcontroller memory in the form of Static RAM (SRAM) was introduced in 1960s. It was later found to have data remanence problems similar to magnetic media with reliable data deletion [1,2,3,4]. Reprogrammable non-volatile memory (NVM) was first introduced as EEPROM in late 1970s and then as Flash in 1980s. They were also found to be affected by data remanence [5,6].

Clone Microcontroller Memory Content Remanence

Reliability of data storage is paramount for modern embedded systems. Many people have come across situations when some microcontroller-based systems started behaving odd or stopped working. This might be home appliances, cars, industrial equipment etc. It seems that a serious reliability issue was overlooked and we might see more systems and devices starting to behave unpredictably or stop working.

If it is a toaster or microwave oven you can cope, but what about old electronics equipment used in cars, aircrafts and industrial infrastructure? Previous research on car systems showed how the malfunction of certain car modules could pose a serious threat to passengers [7,8]. In this research possible cause of embedded systems sporadic failures was found and this could have very serious consequences.

In the 1980s, it was realised that low temperatures can increase the Microcontroller Memory Content Remanence time of SRAM to many seconds or even minutes. With the devices available at that time, it was found that increased data retention started at about −20°C and increased as temperature fell further [2]. Some devices are therefore designed with temperature sensors; any drop below −20°C is treated as a microcontroller attacking event and results in immediate memory zeroisation [9,10]. The experiments described in this paper are set to measure the Memory Content Remanence in modern microcontrollers to see if the low temperature data remanence still exists in embedded devices.