NXP P87C055 Microcontroller Eeprom Data Replication

NXP P87C055 Microcontroller Eeprom Data Replication include take out the data and program from both its eeprom and flash memory, and munipulate its DC electrical supply can help to disable its security system through power glitch method:

1. Typical ratings are not guaranteed. The values listed are at room temperature, 5V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the VOLs of ALE and ports 1 and 3. The noise is due to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations.

In the worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to qualify ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. IOL can exceed these conditions provided that no single output sinks more than 5mA and no more than two outputs exceed the test conditions.

NXP P87C055 Microcontroller Eeprom Data Replication

NXP P87C055 Microcontroller Eeprom Data Replication

3. Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall below the VCC–0.7 specification when the address bits are stabilizing after NXP P87C055 Microcontroller Eeprom Data Replication.
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its maximum value when VIN is approximately 2V.
5. See Figures 37 through 40 for ICC test conditions and Figure 36 for ICC vs Freq.
Active mode: ICC(MAX) = (0.9  FREQ. + 1.1)mA. for all devices except 8XC51RD+; 8XC51RD+ ICC = (0.9 x Freq +2.1) mA Idle mode: ICC(MAX) = (0.18  FREQ. +1.0)mA
6. This value applies to Tamb = 0C to +70C. For Tamb = –40C to +85C, ITL = –750A.

7. Load capacitance for port 0, ALE, and PSEN = 100pF, load capacitance for all other outputs = 80pF.

DC ELECTRICAL CHARACTERISTICS

DC ELECTRICAL CHARACTERISTICS

8. Under steady state (non-transient) conditions, IOL must be externally limited as follows: Maximum IOL per port pin: 15mA (*NOTE: This is 85C specification.) Maximum IOL per 8-bit port: 26mA
Maximum total IOL for all outputs: 71mA
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed test conditions.

9. ALE is tested to VOH1, except when ALE is off then VOH is the voltage specification.
10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25pF. Pin capacitance of ceramic package is less than 15pF (except EA is 25pF).